 
     
    Simulate pulse interference caused by switch switching, relay bounce, and other factors. Conducted along the power and signal lines to the device, cau
 
                         electrostatic discharge
                        electrostatic discharge
                    
             
                         Radio frequency radiation
                        Radio frequency radiation
                    
            
 EFT
EFT 
                         lightning surge
                        lightning surge
                    
             
                         RF conduction
                        RF conduction
                    
             
                         Power Frequency Magnetic Field
                        Power Frequency Magnetic Field
                    
             
                         Pulse magnetic field
                        Pulse magnetic field
                    
             
                         Damped Oscillatory Magnetic Field
                        Damped Oscillatory Magnetic Field
                    
             
                         AC voltage drop
                        AC voltage drop
                    
             
                         Ring wave
                        Ring wave
                    
             
                         Common mode conduction
                        Common mode conduction
                    
             
                         Damped oscillation wave
                        Damped oscillation wave
                    
             
                         Differential mode immunity
                        Differential mode immunity
                    
             
                         DC voltage drop
                        DC voltage drop
                    
             
                         Impulse voltage
                        Impulse voltage
                    
             
                         Radiated Disturbance
                        Radiated Disturbance
                    
             
                         Conducted Disturbance
                        Conducted Disturbance
                    
            The ES-4516A single-phase pulse group surge generator is designed in a dual-function format, capable of simultaneously testing pulse groups and surge items. It supports AC: 0~220V / 16A and DC: 0~110V / 16A, and complies with standards such as IEC6100...
EA-415A Single-Phase Pulse Generator Supports AC:0~220V/16A,DC:0~110V/16A,Compliant with standards IEC 61000-4-4 and GB/T 17626.4...
ES-435B 三相脉冲群发生器(电快速瞬变脉冲群模拟器)支持AC:0~380V/32A,DC:0~110V/32A测试,符合标准IEC61000-4-4、GB/T17626.4...
ES-435 大电流系列 三相脉冲群发生器广泛应用于充电桩、新能源汽车、风力发电等领域,采用了高压保护设计,安全可靠,样品容量支持AC:380V~1100V可选,DC:1100V~2500V可选,电流范围:63A~200A 可选...
配合电快速瞬变脉冲群发生器实现对通讯线/控制线的脉冲群试验。...
脉冲群发生器校验套件50Ω和1000Ω专用脉冲群衰减器,主要用于定期对脉冲群发生器,抗扰度测试仪等测试系统本身的校验,保证发生器输出的波形正确...
根据IEC61000-4-4、GB/T17626.4标准要求,电快速瞬变脉冲群试验需在参考地平面上进行,参考地金属板厚度不小于1.5mm...